Thermo–optic coefficient of porous silicon

Authors

Lorenzo P. Lopez Condensed Matter Physics Laboratory, National Institute of Physics, University of the Philippines, Diliman
Maria Angela B. Faustino National Institute of Physics, University of the Philippines Diliman
Niel Gabriel E. Saplagio National Institute of Physics, University of the Philippines Diliman
Arvin I. Mabilangan National Institute of Physics, University of the Philippines, Diliman
Armando S. Somintac National Institute of Physics, University of the Philippines Diliman

Abstract

Thermo-optic coefficients of porous silicon having the same thickness but different porosities have been calculated. Boron-doped silicon substrates have been electrochemically etched in a 12% HF solution at current densities 2.5mA/cm² and 15mA/cm² to fabricate ~1μm thick porous silicon. Temperature-dependent reflectance spectroscopy was performed to calculate the refractive index, porosity, and thermo-optic coefficient of the samples. Using the Bruggeman effective medium approximation formula, the calculated porosities of the samples were found to be 66.37% and 77.29% respectively. In the temperature range of 303.15K–484.15K, thermo-optic coefficients of -4.0x10^-4K^-1 and -3.0x10^-4K^-1 were obtained. Simulation data was also obtained using a Sellmeier fit to verify the reflectance spectra of porous silicon.

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Issue

2013: Proceedings of the 31st Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP2013-2A-2

Section

Materials Science

Published

2013-10-23

How to Cite

[1]

LP Lopez, MAB Faustino, NGE Saplagio, AI Mabilangan, and AS Somintac, Thermo–optic coefficient of porous silicon, Proceedings of the Samahang Pisika ng Pilipinas 31, SPP2013-2A-2 (2013). URL: https://proceedings.spp-online.org/article/view/SPP2013-2A-2.