Reflectivity of textured GaAs modeled as graded index film

Authors

Rhenish Simon Department of Physical Sciences and Mathematics, University of the Philippines Manila
Nina Angelica Fabroa Zambale National Institute of Physics, University of the Philippines Diliman
Maria Isabel Carillo National Institute of Physics, University of the Philippines Diliman
Armando Somintac National Institute of Physics, University of the Philippines Diliman
Arnel Salvador National Institute of Physics, University of the Philippines Diliman
Elmer Estacio National Institute of Physics, University of the Philippines Diliman
Nathaniel Hermosa National Institute of Physics, University of the Philippines Diliman

Abstract

We measure the reflectivity of the textured GaAs surface to confirm if it possesses the optical properties of a graded index layer. Using the cross section micrographs of the textured sample, we measured its texture thickness and use it as the length of the graded index region. Experimental reflectivity measurements exhibit a good match to that of the numerical simulations for a graded index thin film.

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Issue

2019: Proceedings of the 37th Samahang Pisika ng Pilipinas Physics Conference

Article ID

SPP-2019-1B-05

Section

Ultrafast Optics, Photonics, and Terahertz Physics

Published

2019-05-24

How to Cite

[1]

R Simon, NAF Zambale, MI Carillo, A Somintac, A Salvador, E Estacio, and N Hermosa, Reflectivity of textured GaAs modeled as graded index film, Proceedings of the Samahang Pisika ng Pilipinas 37, SPP-2019-1B-05 (2019). URL: https://proceedings.spp-online.org/article/view/SPP-2019-1B-05.