LabVIEW-based automated multi-channel curve tracer for characterization of Field Effect Transistors

Authors

Mary Grace Morriel Latorre Physics Division, Institute of Mathematical Sciences and Physics, University of the Philippines Los Baños
Nelio Altoveros Physics Division, Institute of Mathematical Sciences and Physics, University of the Philippines Los Baños
Julius Cris Salinas Physics Division, Institute of Mathematical Sciences and Physics, University of the Philippines Los Baños

Abstract

A curve tracer with an automated voltage and current controller was designed, constructed, calibrated and tested. An array of field effect transistors (FETs) was tested and characterized by this instrument. A user interface is developed which allows the operator to enter the drain and gate sweep voltages to be fed to the system and the selection of the FETs among the 64 are to be tested. A real-time graph shows the IV (current voltage characteristic curves for every FET. The common parameters of the FET such as pinch off voltage, cut off voltage and maximum drain current at shorted gate configuration were determined. The experimental values were compared to the theoretical ones obtained from the manufacturer’s datasheet. With the automation process of three highly accurate, precise and calibrated devices and microcontroller-based sequential multiplexing for the FET selection testing, a faster highly reliable data processing was realized. The system is thus recommended for use in multiple FET characterization and for further applications such as biosensing applications using Carbon Nanotube FET array integrated circuits.

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Issue

2011: Proceedings of the 29th Samahang Pisika ng Pilipinas National Physics Congress

Article ID

SPP2011-5C-3

Section

Instrumentation Physics

Published

2011-10-24

How to Cite

[1]

MGM Latorre, N Altoveros, and JC Salinas, LabVIEW-based automated multi-channel curve tracer for characterization of Field Effect Transistors, Proceedings of the Samahang Pisika ng Pilipinas 29, SPP2011-5C-3 (2011). URL: https://proceedings.spp-online.org/article/view/SPP2011-5C-3.