Raman scattering spectroscopy of harvested silicon nanowires

Authors

  • Joseph Christopher Ragasa National Institute of Physics, University of the Philippines Diliman
  • Neil Irvin Cabello National Institute of Physics, University of the Philippines Diliman
  • Jessica Pauline Afalla National Institute of Physics, University of the Philippines Diliman
  • Kaye Ann delas Alas National Institute of Physics, University of the Philippines Diliman
  • Armando Somintac National Institute of Physics, University of the Philippines Diliman

Abstract

High aspect ratio silicon nanowires were fabricated via silver assisted electroless etching. The nanowires were harvested from the parent substrate using a Hi 6512 photoresist and subjected to a micro-Raman scattering spectroscopy. Shifts and broadening in the Raman spectra peak of silicon were observed and attributed to inhomogeneous localized heating due to the incident laser used in the optical characterization.

Downloads

Issue

Article ID

SPP2012-4A-4

Section

Instrumentation Physics

Published

2012-10-22

How to Cite

[1]
JC Ragasa, NI Cabello, JP Afalla, KA delas Alas, and A Somintac, Raman scattering spectroscopy of harvested silicon nanowires, Proceedings of the Samahang Pisika ng Pilipinas 30, SPP2012-4A-4 (2012). URL: https://proceedings.spp-online.org/article/view/SPP2012-4A-4.