Transport properties of In-added Bi2Sr2CaCu2O8+d thick films
We report the transport properties of In-added Bi2Sr2CaCu2O8+d (Bi-2212) thick films. We found that critical temperature (Tc) and critical current density (Jc) increase with In2O3 addition. Despite the high Tc and phase purity, the critical current densities measured are only in the order of few MA/m2 for both pure and In-added film. Low Jc values are attributed to impurities and misoriented structures causing highly resistive intergrain connections.