Transmission spectroscopy of CeO₂ thin film deposited on glass via femtosecond pulsed laser deposition

Authors

Jessa Jayne Miranda National Institute of Physics, University of the Philippines- Diliman
Joseph De Mesa National Institute of Physics, University of the Philippines Diliman
Ymmanuel Gaffud National Institute of Physics, University of the Philippines Diliman
Angelo Rillera National Institute of Physics, University of the Philippines Diliman
Roland Sarmago National Institute of Physics, University of the Philippines Diliman
Wilson Garcia National Institute of Physics, University of the Philippines Diliman

Abstract

Femtosecond pulsed laser deposition (fs-PLD) was used to deposit CeO₂onto a glass substrate. The sample was characterized using optical transmission spectroscopy to observe the transmittance and calculate the index of refraction for different points in the sample. The difference in the transmittance imply that the thickness varies for each position and may be caused by the evolving behavior of the plasma plume during the fs-PLD process. The variation of the index of refraction as a function of wavelength was found to be dependent on the position on the sample.

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Issue

2019: Proceedings of the 37th Samahang Pisika ng Pilipinas Physics Conference

Article ID

SPP-2019-1E-07

Section

Condensed Matter Physics and Materials Science

Published

2019-05-21

How to Cite

[1]

JJ Miranda, J De Mesa, Y Gaffud, A Rillera, R Sarmago, and W Garcia, Transmission spectroscopy of CeO2 thin film deposited on glass via femtosecond pulsed laser deposition, Proceedings of the Samahang Pisika ng Pilipinas 37, SPP-2019-1E-07 (2019). URL: https://proceedings.spp-online.org/article/view/SPP-2019-1E-07.