Transmission spectroscopy of CeO2 thin film deposited on glass via femtosecond pulsed laser deposition
Femtosecond pulsed laser deposition (fs-PLD) was used to deposit CeO2 onto a glass substrate. The sample was characterized using optical transmission spectroscopy to observe the transmittance and calculate the index of refraction for different points in the sample. The difference in the transmittance imply that the thickness varies for each position and may be caused by the evolving behavior of the plasma plume during the fs-PLD process. The variation of the index of refraction as a function of wavelength was found to be dependent on the position on the sample.