Ultrafast pulsed laser deposition of BSCCO target on silicon substrate
Smooth films were deposited via pulsed laser ablation of a Bi2Sr2CaCu2O8+δ bulk target on silicon. SEM micrographs reveal as-deposited films that are about a micron thick and with indistinguishable grain sizes even at high magnification. Crystallization was observed in the annealed films. The XRD spectrum reveals the crystallinity of the film but the peaks correspond to crystal orientations that may have come from dissociated BSCCO compounds. Further material analysis will be carried out for this preliminary study on the deposition of smooth high-temperature superconducting films.