Comparison of sensitivity between reflectivity and angular Goos-Hänchen shift measurements in determining the thickness of CuO film on Cu substrate

  • Cherrie May Mogueis Olaya National Institute of Physics, University of the Philippines Diliman
  • Jenny Lou Balbuena Sagisi National Institute of Physics, University of the Philippines Diliman
  • Nathaniel Placido Hermosa, II National Institute of Physics, University of the Philippines Diliman

Abstract

We compare the sensitivity of measuring the reflectivity and angular Goos-Hänchen ΘGH shift to determine CuO film thickness on a Cu substrate. Calculation of the response of the detectors used in reflectivity and beamshift measurements showed the capability of both techniques in measuring film thickness less than 8 nm. Our results showed that the response of a photodiode in reflectivity measurements is three orders of magnitude more sensitive than using a quadrant detector (QD) for beamshift measurements.

Published
2018-05-29
How to Cite
[1]
C. M. Olaya, J. L. Sagisi, and N. Hermosa. Comparison of sensitivity between reflectivity and angular Goos-Hänchen shift measurements in determining the thickness of CuO film on Cu substrate, Proceedings of the Samahang Pisika ng Pilipinas 36, SPP-2018-PA-34 (2018). URL: https://paperview.spp-online.org/proceedings/article/view/SPP-2018-PA-34.
Section
Poster Session A (Materials Science, Instrumentation, and Photonics)