XRD analysis on the effect of annealing temperature and flux content on the formation of epitaxial YBa2Cu3O7-δ thin films deposited via sedimentation

Authors

  • Rusty A. Lopez National Institute of Physics, University of the Philippines Diliman
  • Jerome C. Taguba National Institute of Physics, University of the Philippines Diliman
  • Roland V. Sarmago National Institute of Physics, University of the Philippines Diliman

Abstract

YBa2Cu3O7-δ thin films were fabricated using sedimentation deposition method on STO (100) substrates. Annealing temperature and flux content were varied to impose epitaxial growth while maintaining phase purity. From XRD data analysis, it was observed that the addition of 15 wt.% KCl to the precursor powder followed by quench annealing at 1010°C for 30 minutes produced highly c-axis oriented films with virtually no phase segregation.

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Article ID

SPP2014-PA-11

Section

Poster Session PA

Published

2014-10-17

How to Cite

[1]
RA Lopez, JC Taguba, and RV Sarmago, XRD analysis on the effect of annealing temperature and flux content on the formation of epitaxial YBa2Cu3O7-δ thin films deposited via sedimentation, Proceedings of the Samahang Pisika ng Pilipinas 32, SPP2014-PA-11 (2014). URL: https://proceedings.spp-online.org/article/view/1858.