Structural and morphological characterization of Nd:YAG on Silicon (100) grown by femtosecond pulsed laser deposition with nitrogen and oxygen background gases

Authors

Arriane P. Lacaba National Institute of Physics, University of the Philippines Diliman
Floyd Willis I. Patricio National Institute of Physics, University of the Philippines Diliman
Annaliza C. Amo National Institute of Physics, University of the Philippines Diliman
Lean L. Dasallas National Institute of Physics, University of the Philippines Diliman
Wilson O. Garcia National Institute of Physics, University of the Philippines Diliman

Abstract

Nd:YAG was grown on silicon (100) by femtosecond pulsed laser deposition with nitrogen and with oxygen background gas. The base pressure was 4x10^-5 mbar with gas pressures varied at 4, 6 and 8x10^-2 mbar. XRD spectra showed that the crystalline property of the deposited samples highly depends on background pressure. As the gas pressure increases, the XRD FWHM decreases, indicating an improved crystallinity. It was also shown that the deposition technique was capable of growing nanocrystalline particles in the YAG (632) plane. The crystallite size was shown to increase with gas pressure. SEM images revealed that Nd:YAG rod structures were grown in nitrogen background gas while coalescence of particles was observed for the samples deposited in oxygen background gas. Lastly, it was shown that as the gas pressure increases, average particle size increases.

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Issue

2015: Proceedings of the 33rd Samahang Pisika ng Pilipinas Physics Congress

Article ID

SPP-2015-PA-21

Section

Poster Session PA

Published

2015-06-03

How to Cite

[1]

AP Lacaba, FWI Patricio, AC Amo, LL Dasallas, and WO Garcia, Structural and morphological characterization of Nd:YAG on Silicon (100) grown by femtosecond pulsed laser deposition with nitrogen and oxygen background gases, Proceedings of the Samahang Pisika ng Pilipinas 33, SPP-2015-PA-21 (2015). URL: https://proceedings.spp-online.org/article/view/1180.